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The Past and Future of Measuring Flicker

  • Session Number:T2 S2 P3
Wednesday, March 01, 2017: 2:15 PM - 2:45 PM


Ethan Biery
Design and Development Leader
Lutron Electronics
United States


There are several existing measurement metrics and recommended practices that attempt to quantify the very difficult-to-describe phenomenon commonly referred to as flicker.  This presentation will review the existing state of the industry, including the benefits and drawbacks of common methods.  Better, but less well known, methods for measuring flicker will be presented.  The presentation will conclude with an update on forthcoming work from a NEMA technical group describing a formal method of measurement for flicker.